Items where authors include "Nguyen, T.-S."

Article

Do, H.-B. orcid.org/0000-0003-3274-5050, Luc, Q.-H., Pham, P.V. et al. (4 more authors) (2023) Metal-induced trap states: the roles of interface and border traps in HfO2/InGaAs. Micromachines, 14 (8). 1606. ISSN 2072-666X