Items where authors include "Navon, Y."

Article

Ventalon, C., Kirichuk, O., Navon, Y. et al. (5 more authors) (2025) Optical Sectioning for Reflection Interference Microscopy: Quantitative Imaging at Soft Interfaces. Langmuir, 41 (15). pp. 10040-10051. ISSN 0743-7463