Items where authors include "Miao, Y."

Number of items: 7.

Article

Hayrapetyan, A., Tumasyan, A. orcid.org/0009-0000-0684-6742, Adam, W. orcid.org/0000-0001-9099-4341 et al. (5283 more authors) (2024) Combination of measurements of the top quark mass from data collected by the ATLAS and CMS experiments at s = 7 and 8 TeV. Physical Review Letters, 132. 261902. ISSN 0031-9007

Hayrapetyan, A., Tumasyan, A. orcid.org/0009-0000-0684-6742, Adam, W. orcid.org/0000-0001-9099-4341 et al. (5283 more authors) (2024) Combination of measurements of the top quark mass from data collected by the ATLAS and CMS experiments at s =7 and 8 TeV. Physical Review Letters, 132. 261902. ISSN 0031-9007

Miao, Y., Deng, J., Ding, G. et al. (1 more author) (2024) Confidence-guided centroids for unsupervised person re-identification. IEEE Transactions on Information Forensics and Security, 19. pp. 6471-6483. ISSN 1556-6013

Aad, G. orcid.org/0000-0002-6665-4934, Abbott, B. orcid.org/0000-0002-5888-2734, Abeling, K. orcid.org/0000-0002-1002-1652 et al. (5287 more authors) (2024) Evidence for the Higgs boson decay to a Z boson and a photon at the LHC. Physical Review Letters, 132 (2). 021803. ISSN 0031-9007

Miao, Y. orcid.org/0009-0004-4797-5187, Shao, Y. and Zhang, J. (2024) IRS backscatter-based secrecy enhancement against active eavesdropping. Electronics, 13 (2). 265. ISSN 1450-5843

Zhang, H., Yao, J., Zhang, X. et al. (5 more authors) (2023) Selective Photocatalytic Activities of Amino Acids/Peptide-Ti3C2Tx-TiO2 Composites Induced by Calcination: Adsorption Enhancement vs Charge Transfer Enhancement. Journal of Physical Chemistry C, 127 (5). pp. 2231-2245. ISSN 1932-7447

Proceedings Paper

Miao, Y., Deng, J. and Han, J. (2024) WaveFace: authentic face restoration with efficient frequency recovery. In: Proceedings of 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR). 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 16-22 Jun 2024, Seattle WA, USA. Institute of Electrical and Electronics Engineers (IEEE) , pp. 6583-6592. ISBN 9798350353013

This list was generated on Wed Apr 2 15:48:07 2025 BST.