Items where authors include "Medina-Bulo, Inmaculada"

Number of items: 6.

Article

Castro-Cabrera, M. Carmen de, García-Dominguez, Antonio orcid.org/0000-0002-4744-9150 and Medina-Bulo, Inmaculada (2023) CMBMeTest:Generation of Test Suites Using Model-Based Testing Plus Constraint Programming and Metamorphic Testing. Electronics (Switzerland). 18. ISSN 2079-9292

García-Domínguez, Antonio orcid.org/0000-0002-4744-9150, Palomo-Lozano, Francisco, Medina-Bulo, Inmaculada et al. (2 more authors) (2023) Computing performance requirements for web service compositions. Computer Standards and Interfaces. 103664. ISSN 0920-5489

Delgado-Pérez, Pedro, Habli, Ibrahim orcid.org/0000-0003-2736-8238, Gregory, Steve et al. (3 more authors) (2018) Evaluation of Mutation Testing in a Nuclear Industry Case Study. IEEE Transactions on Reliability. 8453820. pp. 1406-1419. ISSN 0018-9529

Palomo-Duarte, Manuel, García-Domínguez, Antonio orcid.org/0000-0002-4744-9150 and Medina-Bulo, Inmaculada (2014) Automatic dynamic generation of likely invariants for WS-BPEL compositions. Expert systems with applications. pp. 5041-5055. ISSN 0957-4174

Proceedings Paper

De Castro-Cabrera, M. Del Carmen, García-Dominguez, Antonio orcid.org/0000-0002-4744-9150 and Medina-Bulo, Inmaculada (2020) Trends in prioritization of test cases:2017-2019. In: 35th Annual ACM Symposium on Applied Computing, SAC 2020. 35th Annual ACM Symposium on Applied Computing, SAC 2020, 30 Mar - 03 Apr 2020. Proceedings of the ACM Symposium on Applied Computing . Association for Computing Machinery, Inc , CZE , pp. 2005-2011.

Carmen De Castro-Cabrera, M., Garcia-Dominguez, Antonio orcid.org/0000-0002-4744-9150 and Medina-Bulo, Inmaculada (2019) Using constraint solvers to support metamorphic testing. In: Proceedings - 2019 IEEE/ACM 4th International Workshop on Metamorphic Testing, MET 2019. 4th IEEE/ACM International Workshop on Metamorphic Testing, MET 2019, 26 May 2019. Proceedings - 2019 IEEE/ACM 4th International Workshop on Metamorphic Testing, MET 2019 . Institute of Electrical and Electronics Engineers Inc. , CAN , pp. 32-39.

This list was generated on Wed Apr 2 15:18:57 2025 BST.