Items where authors include "Lévai, Z."

Article

Lévai, Z., Shin, D. and McMinn, P. orcid.org/0000-0001-9137-7433 (2026) A comprehensive empirical and theoretical analysis of batching algorithms for efficient, safe, parallel mutation analysis in rust. ACM Transactions on Software Engineering and Methodology. ISSN 1049-331X

Proceedings Paper

Lévai, Z. and McMinn, P. orcid.org/0000-0001-9137-7433 (2023) Batching non-conflicting mutations for efficient, safe, parallel mutation analysis in rust. In: 2023 IEEE Conference on Software Testing, Verification and Validation (ICST). 16th IEEE International Conference on Software Testing, Verification and Validation (ICST) 2023, 16-20 Apr 2023, Dublin, Ireland. Institute of Electrical and Electronics Engineers (IEEE) , pp. 49-59. ISBN 978-1-6654-5667-8