Items where authors include "Krishna, S."

Article

Liu, Y. orcid.org/0000-0003-3034-9628, Jin, X. orcid.org/0000-0002-7205-3318, Jung, H. orcid.org/0000-0002-5250-4767 et al. (5 more authors) (2024) Electroabsorption in InGaAs and GaAsSb p-i-n photodiodes. Applied Physics Letters, 125 (22). 221107. ISSN 0003-6951

Jung, H. orcid.org/0000-0002-5250-4767, Lee, S. orcid.org/0000-0002-5669-1555, Jin, X. orcid.org/0000-0002-7205-3318 et al. (5 more authors) (2024) Low excess noise and high quantum efficiency avalanche photodiodes for beyond 2 µm wavelength detection. Communications Materials, 5 (1). 219. ISSN 2662-4443

Lewis, H.I.J., Jin, X., Guo, B. et al. (8 more authors) (2023) Anomalous excess noise behavior in thick Al0.85Ga0.15As0.56Sb0.44 avalanche photodiodes. Scientific Reports, 13. 9936. ISSN 2045-2322

Jung, H. orcid.org/0000-0002-5250-4767, Lee, S. orcid.org/0000-0002-5669-1555, Liu, Y. orcid.org/0000-0003-3034-9628 et al. (3 more authors) (2023) High electric field characteristics of GaAsSb photodiodes on InP substrates. Applied Physics Letters, 122 (22). 221102. ISSN 0003-6951

Lee, S. orcid.org/0000-0002-5669-1555, Jin, X. orcid.org/0000-0002-7205-3318, Jung, H. et al. (10 more authors) (2023) High gain, low noise 1550  nm GaAsSb/AlGaAsSb avalanche photodiodes. Optica, 10 (2). 147. ISSN 2334-2536

Vines, P., Tan, C.H., David, J.P.R. et al. (5 more authors) (2011) Versatile spectral imaging with an algorithm-based spectrometer using highly tuneable quantum dot infrared photodetectors. IEEE Journal of Quantum Electronics, 47 (2). pp. 190-197. ISSN 0018-9197

Proceedings Paper

Liu, Y. orcid.org/0000-0003-3034-9628, Jin, X. orcid.org/0000-0002-7205-3318, Lee, S. et al. (10 more authors) (2024) Very high gain and low noise GaAsSb/AlGaAsSb avalanche photodiodes for 1550nm detection at room temperature. In: Jiang, S. and Digonnet, M.J., (eds.) Optical Components and Materials XXI. Optical Components and Materials XXI, 27 Jan - 01 Feb 2024, San Francisco, California, United States. Society of Photo Optical Instrumentation Engineers (SPIE) . ISBN 9781510670242