Items where authors include "Khomh, F."

Article

Biagiola, M., Cardozo, N., Shin, D. orcid.org/0000-0002-0840-6449 et al. (3 more authors) (2023) Summary of the fourth international workshop on deep learning for testing and testing for deep learning (DeepTest 2023). ACM SIGSOFT Software Engineering Notes, 48 (4). pp. 39-40. ISSN 0163-5948