Items where authors include "Khomh, F."

Article

Biagiola, M., Cardozo, N., Shin, D. orcid.org/0000-0002-0840-6449 et al. (3 more authors) (2023) Summary of the fourth international workshop on deep learning for testing and testing for deep learning (DeepTest 2023). ACM SIGSOFT Software Engineering Notes, 48 (4). pp. 39-40. ISSN 0163-5948

Proceedings Paper

Biagiola, M., Cardozo, N., Khomh, F. et al. (3 more authors) (2024) The 5th Workshop on Testing for Deep Learning and Deep Learning for Testing (DeepTest 2024). In: Proceedings 2024 IEEE ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning Deeptest 2024. DeepTest '24: 5th IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, 20 Apr 2024, Lisbon, Portugal. The Association for Computing Machinery , vii-vii. ISBN 9798400705748