Items where authors include "KETTLE, JEFF"

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Dhimish, Mahmoud and KETTLE, JEFF (2021) Impact of Solar Cell Cracks Caused During Potential-Induced Degradation (PID) Tests. IEEE Transactions on Electron Devices. pp. 604-612. ISSN 0018-9383

This list was generated on Sat Apr 13 23:22:03 2024 BST.