Items where authors include "Hilton, M."

Article

Parry, O. orcid.org/0000-0002-0917-1274, Kapfhammer, G.M., Hilton, M. et al. (1 more author) (2023) Empirically evaluating flaky test detection techniques combining test case rerunning and machine learning models. Empirical Software Engineering, 28. 72. ISSN 1382-3256

Kousathanas, A. orcid.org/0000-0001-6265-6521, Pairo-Castineira, E. orcid.org/0000-0002-2423-3090, Rawlik, K. orcid.org/0000-0002-0010-370X et al. (2377 more authors) (2022) Whole-genome sequencing reveals host factors underlying critical COVID-19. Nature, 607. pp. 97-103. ISSN 0028-0836

Parry, O., Kapfhammer, G.M., Hilton, M. et al. (1 more author) (2022) A survey of flaky tests. ACM Transactions on Software Engineering and Methodology, 31 (1). 17. ISSN 1049-331X

Proceedings Paper

Parry, O. orcid.org/0000-0002-0917-1274, Kapfhammer, G. orcid.org/0000-0002-7706-2299, Hilton, M. orcid.org/0000-0001-9195-6902 et al. (1 more author) (2025) Systemic flakiness: an empirical analysis of co-occurring flaky test failures. In: Ali Babar, M., Tosun, A., Wagner, S. and Stray, V., (eds.) Proceedings of the 29th International Conference on Evaluation and Assessment in Software Engineering. 29th International Conference on Evaluation and Assessment in Software Engineering (EASE 25), 17-20 Jun 2025, Istanbul, Turkiye. Association for Computing Machinery , pp. 476-487. ISBN 9798400713859

Parry, O., Kapfhammer, G.M., Hilton, M. et al. (1 more author) (2022) Surveying the developer experience of flaky tests. In: ICSE-SEIP '22: Proceedings of the 44th International Conference on Software Engineering: Software Engineering in Practice. ICSE '22: 44th International Conference on Software Engineering, 21-29 May 2022, Pennsylvania, Pittsburgh. Association for Computing Machinery (ACM) , pp. 253-262. ISBN 9781450392266

Parry, O., Kapfhammer, G.M., Hilton, M. et al. (1 more author) (2022) Evaluating features for machine learning detection of order- and non-order-dependent flaky tests. In: Proceedings of 2022 IEEE Conference on Software Testing, Verification and Validation (ICST). 2022 IEEE Conference on Software Testing, Verification and Validation (ICST), 04-14 Apr 2022, Valencia, Spain. Institute of Electrical and Electronics Engineers (IEEE) , pp. 93-104. ISBN 9781665466806