Items where authors include "Hilton, M."

Article

Parry, O. orcid.org/0000-0002-0917-1274, Kapfhammer, G.M., Hilton, M. et al. (1 more author) (2023) Empirically evaluating flaky test detection techniques combining test case rerunning and machine learning models. Empirical Software Engineering, 28. 72. ISSN 1382-3256

Kousathanas, A. orcid.org/0000-0001-6265-6521, Pairo-Castineira, E. orcid.org/0000-0002-2423-3090, Rawlik, K. orcid.org/0000-0002-0010-370X et al. (2377 more authors) (2022) Whole-genome sequencing reveals host factors underlying critical COVID-19. Nature, 607. pp. 97-103. ISSN 0028-0836

Parry, O., Kapfhammer, G.M., Hilton, M. et al. (1 more author) (2022) A survey of flaky tests. ACM Transactions on Software Engineering and Methodology, 31 (1). 17. ISSN 1049-331X

Proceedings Paper

Parry, O., Kapfhammer, G.M., Hilton, M. et al. (1 more author) (2022) Surveying the developer experience of flaky tests. In: ICSE-SEIP '22: Proceedings of the 44th International Conference on Software Engineering: Software Engineering in Practice. ICSE '22: 44th International Conference on Software Engineering, 21-29 May 2022, Pennsylvania, Pittsburgh. Association for Computing Machinery (ACM) , pp. 253-262. ISBN 9781450392266

Parry, O., Kapfhammer, G.M., Hilton, M. et al. (1 more author) (2022) Evaluating features for machine learning detection of order- and non-order-dependent flaky tests. In: Proceedings of 2022 IEEE Conference on Software Testing, Verification and Validation (ICST). 2022 IEEE Conference on Software Testing, Verification and Validation (ICST), 04-14 Apr 2022, Valencia, Spain. Institute of Electrical and Electronics Engineers (IEEE) , pp. 93-104. ISBN 9781665466806