Items where authors include "Galiana, B"

Article

Navarro, A, García-Tabarés, E, Ramasse, QM orcid.org/0000-0001-7466-2283 et al. (3 more authors) (2023) Advanced transmission electron microscopy investigation of defect formation in movpe-growth of gap on silicon using arsenic initial coverage. Applied Surface Science, 610. 155578. ISSN 0169-4332