Items where authors include "Donnelly, S"

Article

Lim, J, Prestat, E, Carlsson, A et al. (4 more authors) (2020) Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study. Microscopy and Microanalysis, 26 (S2). pp. 394-395. ISSN 1431-9276