Items where authors include "Choi, F.S."

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Article

Choi, F.S., Griffiths, J.T., Ren, C. et al. (7 more authors) (2018) Vertical leakage mechanism in GaN on Si high electron mobility transistor buffer layers. Journal of Applied Physics, 124 (5). 055702. ISSN 0021-8979

This list was generated on Tue Apr 1 17:32:05 2025 BST.