Items where authors include "Cao, F."

Article

Feigin, V.L., Abate, M.D., Abate, Y.H. et al. (1400 more authors) (2024) Global, regional, and national burden of stroke and its risk factors, 1990–2021: a systematic analysis for the Global Burden of Disease Study 2021. The Lancet Neurology, 23 (10). pp. 973-1003. ISSN 1474-4422

Bhattacharjee, N.V., Schumacher, A.E., Aali, A. et al. (1403 more authors) (2024) Global fertility in 204 countries and territories, 1950–2021, with forecasts to 2100: a comprehensive demographic analysis for the Global Burden of Disease Study 2021. The Lancet, 403 (10440). pp. 2057-2099. ISSN 0140-6736

Brauer, M., Roth, G.A., Aravkin, A.Y. et al. (1792 more authors) (2024) Global burden and strength of evidence for 88 risk factors in 204 countries and 811 subnational locations, 1990–2021: a systematic analysis for the Global Burden of Disease Study 2021. The Lancet, 403 (10440). pp. 2162-2203. ISSN 0140-6736

Mensah, G.A., Fuster, V., Murray, C.J.L. et al. (1194 more authors) (2023) Global burden of cardiovascular diseases and risks, 1990-2022. Journal of the American College of Cardiology, 82 (25). pp. 2350-2473. ISSN 0735-1097

Bono, J., Guo, L., Raue, B. A. et al. (107 more authors) (2018) First measurement of Xi(-) polarization in photoproduction. Physics Letters, Section B: Nuclear, Elementary Particle and High-Energy Physics. pp. 280-286. ISSN 0370-2693

Kunkel, M. C., Amaryan, M. J., Strakovsky, I. I. et al. (142 more authors) (2018) Exclusive photoproduction of pi degrees up to large values of Mandelstam variables s, t, and u with CLAS. Physical Review C. 015207. ISSN 2469-9993

Proceedings Paper

Cao, F., Hunter, T. orcid.org/0000-0003-3922-491X, Kale, G. orcid.org/0000-0002-3021-5905 et al. (1 more author) (2024) Measurement of Particle Size Distribution in Nano Colloidal Dispersions Using Electrochemical Impedance Spectroscopy. In: 2024 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2024. 2024 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 29 Jul - 02 Aug 2024, Zhongshan, China. Institute of Electrical and Electronics Engineers (IEEE) , pp. 458-461. ISBN 979-8-3503-6210-7