Items where authors include "Boehm, S."

Article

Walther, T. orcid.org/0000-0003-3571-6263, Creasey‐Gray, S., Boehm, S. et al. (2 more authors) (2025) Comparison of different X‐ray‐based scanning electron microscopy methods to detect sub‐nanometre ultra‐thin InAs layers deposited on top of GaAs. Journal of Microscopy. ISSN 0022-2720