Items where authors include "Batley, J"

Article

Rosamond, MC, Batley, J, Burnell, G et al. (2 more authors) (2015) High contrast 3D proximity correction for electron-beam lithography: An enabling technique for the fabrication of suspended masks for complete device fabrication within an UHV environment. Microelectronic Engineering, 143. 5 - 10. ISSN 0167-9317