Items where authors include "Atkinson, J.B.P."

Article

Atkinson, J.B.P. orcid.org/0009-0002-6371-1953 and Howse, J.R. orcid.org/0000-0003-1503-2083 (2025) In-situ full-wafer metrology via coupled white light and monochromatic stroboscopic illumination. Optics and Lasers in Engineering, 184 (Part 2). 108692. ISSN 0143-8166