Maiden, A, Sarahan, M.C., Stagg, M.D. et al. (2 more authors) (2015) Quantitative electron phase imaging with high sensitivity and an unlimited field of view. Scientific Reports, 5. 14690. ISSN 2045-2322
Abstract
As it passes through a sample, an electron beam scatters, producing an exit wavefront rich in information. A range of material properties, from electric and magnetic field strengths to specimen thickness, strain maps and mean inner potentials, can be extrapolated from its phase and mapped at the nanoscale. Unfortunately, the phase signal is not straightforward to obtain. It is most commonly measured using off-axis electron holography, but this is experimentally challenging, places constraints on the sample and has a limited field of view. Here we report an alternative method that avoids these limitations and is easily implemented on an unmodified transmission electron microscope (TEM) operating in the familiar selected area diffraction mode. We use ptychography, an imaging technique popular amongst the X-ray microscopy community; recent advances in reconstruction algorithms now reveal its potential as a tool for highly sensitive, quantitative electron phase imaging.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Funding Information: | Funder Grant number PHASE FOCUS LIMITED NONE |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 12 May 2016 10:33 |
Last Modified: | 12 May 2016 10:33 |
Published Version: | http://dx.doi.org/10.1038/srep14690 |
Status: | Published |
Publisher: | Nature Publishing Group: Open Access Journals - Option C |
Refereed: | Yes |
Identification Number: | 10.1038/srep14690 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:99616 |