Qiao, L., Cheong, J.S., Ong, J.S.L. et al. (4 more authors) (2015) Avalanche Noise in Al0.52In0.48P Diodes. IEEE Photonics Technology Letters, 28 (4). pp. 481-484. ISSN 1041-1135
Abstract
Multiplication and avalanche excess noise measurements have been undertaken on a series of AlInP homojunction p-i-n and n-i-p diodes with i region widths ranging from 0.04 to 0.89 μm, using 442 and 460 nm wavelength light. Low dark currents of <;170 nA cm-2 at 95% of breakdown voltage were obtained in all the devices because of its wide bandgap and there was no tunneling dark current present even at high fields >1000 kV/cm. For a given multiplication factor, the excess noise decreased as the avalanche width decreased due to the dead-space effect. Using 460 nm wavelength light, measurements showed that a separate absorption multiplication avalanche photodiode with a nominal multiplication region width of 0.2 μm had an effective k (hole to electron ionization coefficient ratio) of ~0.3.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2015 IEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. |
Keywords: | Avalanche photodiodes; avalanche multiplication; excess noise; impact ionization; AlInP; narrow band detector |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 05 May 2016 11:31 |
Last Modified: | 28 Mar 2018 19:31 |
Published Version: | http://dx.doi.org/10.1109/LPT.2015.2499545 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers |
Refereed: | Yes |
Identification Number: | 10.1109/LPT.2015.2499545 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:99292 |