Serial block face SEM and TEM imaging for quantitative measurement of cellular uptake of semiconductor quantum dot nanoparticles

Hondow, NS, Brown, MR, Starborg, T et al. (5 more authors) (2015) Serial block face SEM and TEM imaging for quantitative measurement of cellular uptake of semiconductor quantum dot nanoparticles. In: Microscopy and Microanalysis. Microscopy and Microanalysis, 02-06 Aug 2015, Portland, OR. Cambridge University Press, pp. 1553-1554. ISSN: 1431-9276 EISSN: 1435-8115

Metadata

Item Type: Proceedings Paper
Authors/Creators:
  • Hondow, NS
  • Brown, MR
  • Starborg, T
  • Monteith, AG
  • Brydson, R
  • Summers, HD
  • Rees, P
  • Brown, A
Copyright, Publisher and Additional Information:

© Microscopy Society of America 2015. This is an author produced version of a paper published in Microscopy and Microanalysis. Uploaded in accordance with the publisher's self-archiving policy.
Dates:
  • Accepted: 30 March 2015
  • Published: August 2015
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds) > Institute for Materials Research (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 14 Jan 2016 15:43
Last Modified: 16 Nov 2016 16:26
Published Version: http://dx.doi.org/10.1017/S143192761500854
Status: Published
Publisher: Cambridge University Press
Identification Number: 10.1017/S143192761500854
Open Archives Initiative ID (OAI ID):

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