Cattle, J, S'ari, M, Hondow, N et al. (3 more authors) (2015) Transmission electron microscopy of a model crystalline organic, theophylline. In: Journal of Physics: Conference Series. ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE (EMAG2015), 30 Jun - 02 Jul 2015, Manchester, UK. IOP Publishing
Abstract
We report on the use of transmission electron microscopy (TEM) to analyse the diffraction patterns of the model crystalline organic theophylline to investigate beam damage in relation to changing accelerating voltage, sample temperature and TEM grid support films. We find that samples deposited on graphene film grids have the longest lifetimes when also held at -190 °C and imaged at 200 kV accelerating voltage. Finally, atomic lattice images are obtained in bright field STEM by working close to the estimated critical electron dose for theophylline.
Metadata
Item Type: | Proceedings Paper |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2015, The Authors. Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds) > Institute for Materials Research (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 18 Jan 2016 09:30 |
Last Modified: | 18 Jan 2016 09:30 |
Published Version: | http://dx.doi.org/10.1088/1742-6596/644/1/012030 |
Status: | Published |
Publisher: | IOP Publishing |
Identification Number: | 10.1088/1742-6596/644/1/012030 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:93515 |