Lewis, P, Micklethwaite, S, Harrington, J et al. (3 more authors) (2015) Exploring backscattered imaging in low voltage FE-SEM. In: Journal of Physics: Conference Series. ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE (EMAG2015), 30 Jun - 02 Jul 2015, Manchester, UK. IOP Publishing
Abstract
Contrast levels in backscattered SEM images were investigated, utilising stage deceleration for low voltage imaging and also electron energy filtering. Image contrast variations are explained via use of Monte Carlo simulations which can predict the optimum accelerating and filter voltages for imaging complex sample mixtures.
Metadata
Item Type: | Proceedings Paper |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2015, The Authors. Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. Published under licence by IOP Publishing Ltd. |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds) > Institute for Materials Research (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 14 Jan 2016 16:03 |
Last Modified: | 18 Jan 2016 09:33 |
Published Version: | http://dx.doi.org/10.1088/1742-6596/644/1/012019 |
Status: | Published |
Publisher: | IOP Publishing |
Identification Number: | 10.1088/1742-6596/644/1/012019 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:93514 |