Ridler, NM and Clarke, RG (2016) Establishing Traceability to the International System of Units for Scattering Parameter Measurements from 750 GHz to 1.1 THz. IEEE Transactions on Terahertz Science & Technology, 6 (1). pp. 2-11. ISSN 2156-342X
Abstract
In this paper, we describe a new measurement capability which provides fully calibrated, traceable scattering parameter measurements in rectangular metallic waveguide in the frequency range 750 GHz-1.1 THz. The instrumentation consists of a vector network analyzer (VNA) with waveguide extender heads, situated at the University of Leeds, Leeds, U.K., and primary measurement standards characterized by the National Physical Laboratory, Teddington, U.K.. The measurement standards consist of lengths of precision waveguide that are used during the calibration of the instrumentation. Traceability to the International System of Units (SI) is established by performing high-precision dimensional measurements on the waveguide sections. A preliminary uncertainty budget is presented, indicating the expected sizes of the main sources of error in both reflection and transmission measurements.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. |
Keywords: | Calibration and measurement, measurement traceability, submillimeter-waves, terahertz, vector network analysis (VNA), waveguides. |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) |
Funding Information: | Funder Grant number EURAMET EMRP-MSU SIB62-REG3 |
Depositing User: | Symplectic Publications |
Date Deposited: | 11 Dec 2015 12:00 |
Last Modified: | 15 Nov 2016 20:55 |
Published Version: | http://dx.doi.org/10.1109/TTHZ.2015.2502068 |
Status: | Published |
Publisher: | IEEE |
Identification Number: | 10.1109/TTHZ.2015.2502068 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:92753 |