New pathways for improved quantification of energy-dispersive X-ray spectra of semiconductors with multiple X-ray lines from thin foils investigated in transmission electron microscopy

Parri, M.C., Qiu, Y. and Walther, T. (2015) New pathways for improved quantification of energy-dispersive X-ray spectra of semiconductors with multiple X-ray lines from thin foils investigated in transmission electron microscopy. Journal of Microscopy, 260 (3). pp. 427-441. ISSN 1365-2818

Metadata

Item Type: Article
Authors/Creators:
  • Parri, M.C.
  • Qiu, Y.
  • Walther, T.
Copyright, Publisher and Additional Information:

© 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society.

This is an author produced version of a paper subsequently published in Journal of Microscopy. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: Analytical transmission electron microscopy; energy-dispersive X-ray spectroscopy; k-factors; quantification
Dates:
  • Published: December 2015
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 28 Jan 2016 14:28
Last Modified: 16 Nov 2016 09:28
Published Version: https://dx.doi.org/10.1111/jmi.12345
Status: Published
Publisher: Wiley
Refereed: Yes
Identification Number: 10.1111/jmi.12345
Open Archives Initiative ID (OAI ID):

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