Hayward, T.J. (2015) Intrinsic Nature of Stochastic Domain Wall Pinning Phenomena in Magnetic Nanowire Devices. Scientific Reports, 5. 13279 . ISSN 2045-2322
Abstract
Finite temperature micromagnetic simulations are used to probe stochastic domain wall pinning behaviours in magnetic nanowire devices. By exploring field-induced propagation both below and above the Walker breakdown field it is shown that all experimentally observed phenomena can be comprehensively explained by the influence of thermal perturbations on the domain walls’ magnetisation dynamics. Nanowires with finite edge roughness are also investigated, and these demonstrate how this additional form of disorder couples with thermal perturbations to significantly enhance stochasticity. Cumulatively, these results indicate that stochastic pinning is an intrinsic feature of DW behaviour at finite temperatures, and would not be suppressed even in hypothetical systems where initial DW states and experimental parameters were perfectly defined.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 02 Nov 2015 14:39 |
Last Modified: | 02 Nov 2015 14:39 |
Published Version: | http://dx.doi.org/10.1038/srep13279 |
Status: | Published |
Publisher: | Nature Publishing Group |
Refereed: | Yes |
Identification Number: | 10.1038/srep13279 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:91416 |