Wan, Q., Plenderleith, R.A., Dapor, M. et al. (3 more authors) (2015) Separating topographical and chemical analysis of nanostructure of polymer composite in low voltage SEM. Journal of Physics: Conference series, 644. 02018. ISSN 1742-6588
Abstract
The possibility of separating the topographical and chemical information in a polymer nano-composite using low-voltage SEM imaging is demonstrated, when images are acquired with a Concentric Backscattered (CBS) detector. This separation of chemical and topographical information is based on the different angular distribution of electron scattering which were calculated using a Monte Carlo simulation. The simulation based on angular restricted detection was applied to a semi-branched PNIPAM/PEGDA interpenetration network for which a linear relationship of topography SEM contrast and feature height data was observed.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2015 The Author(s) Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 01 Dec 2015 17:22 |
Last Modified: | 01 Dec 2015 17:22 |
Published Version: | http://dx.doi.org/10.1088/1742-6596/644/1/012018 |
Status: | Published |
Publisher: | IOP Publishing |
Refereed: | Yes |
Identification Number: | 10.1088/1742-6596/644/1/012018 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:91265 |