Masters, R.C., Wan, Q., Zhou, Y. et al. (5 more authors) (2015) Application of low-voltage backscattered electron imaging to the mapping of organic photovoltaic blend morphologies. Journal of Physics: Conference Series, 644 (1). ISSN 1742-6588
Abstract
With organic photovoltaic (OPV) technology moving towards commercialisation, high-throughput analytical techniques are required to study the nanoscale morphology of OPV blends. We demonstrate a low-voltage backscattered electron imaging technique in the SEM that combines a solid-state backscattered electron detector with stage biasing to produce a rapid overview of the phase-separated surface morphology of an organic photovoltaic (P3HT:PCBM) blend. Aspects of obtaining the best possible results from the technique are discussed along with the possibility of probing the sub-surface morphology by altering the primary electron beam landing energy.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2015 The Author(s) Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 01 Dec 2015 17:18 |
Last Modified: | 01 Dec 2015 17:18 |
Published Version: | http://dx.doi.org/10.1088/1742-6596/644/1/012017 |
Status: | Published |
Publisher: | IOP Publishing |
Refereed: | Yes |
Identification Number: | 10.1088/1742-6596/644/1/012017 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:91264 |