Yang, W.-G., Morley, N.A. and Mark Rainforth, W. (2015) Electric field-controlled magnetization in bilayered magnetic films for magnetoelectric memory. Journal of Applied Physics, 118 (3). 034102. ISSN 0021-8979
Abstract
Bilayered magnetic films (Co<inf>50</inf>Fe<inf>50</inf> (CoFe)/Metglas) were RF sputtered on both (001)-oriented and (011)-oriented PMN-PT (lead magnesium niobate-lead titanate) substrates. Electric field-controlled magnetization changes were observed in all these samples: 65 nm CoFe/24 nm Metglas/(001) PMN-PT, 65 nm CoFe/24 nm Metglas/(011) PMN-PT, and 30 nm CoFe/12 nm Metglas/(011) PMN-PT. The maximum magnetic remanence ratio change (ΔM<inf>r</inf>/M<inf>s</inf>) was 46% for CoFe/Metglas/(001) PMN-PT. In this heterostructure, the electric-field created two new non-volatile switchable remanence states and the as-grown remanence state was altered permanently. High-resolution transmission electron microscopy images show a sharp and smooth interface between Metglas and substrate and conversely a rougher interface was observed between Metglas and CoFe films. In the 30 nm CoFe/12 nm Metglas/(011) PMN-PT sample, a large ΔM<inf>r</inf>/M<inf>s</inf> of 80% along the [100] direction was measured, while the ΔM<inf>r</inf>/M<inf>s</inf> along the [01-1] direction was 60% at the applied electric field of 5 kV/cm, corresponding to a giant magnetoelectric coupling constant α = μ<inf>o</inf>ΔM<inf>r</inf>/E = 2.9 × 10<sup>-6</sup> s/m.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2015 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 29 Oct 2015 14:15 |
Last Modified: | 29 Oct 2015 14:15 |
Published Version: | http://dx.doi.org/10.1063/1.4926875 |
Status: | Published |
Publisher: | American Institute of Physics (AIP) |
Refereed: | Yes |
Identification Number: | 10.1063/1.4926875 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:89081 |