Jarrett, R, Dawson, D, Roelich, K et al. (1 more author) (2014) Calculating material criticality of transparent conductive electrodes used for thin film and third generation solar cells. In: Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th. 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014, 03-18 Jun 2014, Denver, Colorado. Institute of Electrical and Electronics Engineers , 1436 - 1441. ISBN 9781479943982
Abstract
The supply risk and exposure to supply shortage is becoming an important factor in the consideration of a mass low carbon technology roll-out. This study takes current criticality studies, which analyse the criticality of single raw materials, and extends it to calculate the relative criticality of multiple material transparent conductive electrodes (TCE). It compares the calculated criticality with the TCE's Haacke figure of merit. It is found that more recent TCEs developed to replace the commonly used indium tin oxide, such as flurine doped tin oxide and silver nanowires, can have a higher criticality, even though the materials themselves are currently less expensive.
Metadata
Item Type: | Proceedings Paper |
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Authors/Creators: |
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Keywords: | Criticality; silver nanowire; supply risk; thin film; transparent conductive electrode |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Civil Engineering (Leeds) > Institute for Resilient Infrastructure (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 27 Mar 2015 10:26 |
Last Modified: | 19 Dec 2022 13:30 |
Published Version: | http://dx.doi.org/10.1109/PVSC.2014.6925186 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers |
Identification Number: | 10.1109/PVSC.2014.6925186 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:83754 |