Mueckstein, R, Natrella, M, Hatem, O et al. (10 more authors) (2015) Near-field analysis of terahertz pulse generation from photo-excited charge density gradients. IEEE Transactions on Terahertz Science and Technology, 5 (2). 260 - 267. ISSN 2156-342X
Abstract
Excitation of photo-current transients at semiconductor surfaces by subpicosecond optical pulses gives rise to emission of electromagnetic pulses of terahertz (THz) frequency radiation. To correlate the THz emission with the photo-excited charge density distribution and the photo-current direction, we mapped near-field and far-field distributions of the generated THz waves from GaAs and Fe-doped InGaAs surfaces. The experimental results show that the charge dynamics in the plane of the surface can radiate substantially stronger THz pulses than the charge dynamics in the direction normal to the surface, which is generally regarded as the dominant origin of the emission.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | (c) 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works |
Keywords: | Aperture; Dember effect; far-field radiation pattern; near-field radiation; near-field microscopy; emission pattern; pulse generation; terahertz |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Pollard Institute (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 18 Mar 2015 11:58 |
Last Modified: | 19 Jan 2018 06:24 |
Published Version: | http://dx.doi.org/10.1109/TTHZ.2015.2395389 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers |
Identification Number: | 10.1109/TTHZ.2015.2395389 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:83526 |