Palizdar, Y, San Martin, D, Ward, M et al. (3 more authors) (2013) Observation of thermally etched grain boundaries with the FIB/TEM technique. Materials Characterization, 84. 28 - 33. ISSN 1044-5803
Abstract
Thermal etching is a method which is able to reveal and characterize grain boundaries, twins or dislocation structures and determine parameters such as grain boundary energies, surface diffusivities or study phase transformations in steels, intermetallics or ceramic materials. This method relies on the preferential transfer of matter away from grain boundaries on a polished sample during heating at high temperatures in an inert/vacuum atmosphere. The evaporation/diffusion of atoms at high temperatures results in the formation of grooves at the intersections of the planes of grain/twin boundaries with the polished surface. This work describes how the combined use of Focussed Ion Beam and Transmission Electron Microscopy can be used to characterize not only the grooves and their profile with the surface, but also the grain boundary line below the groove, this method being complementary to the commonly used scanning probe techniques.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Keywords: | Focussed Ion Beam; Steel; Thermal etching; Transmission electron microscopy |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds) > Institute for Materials Research (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 23 Apr 2014 11:26 |
Last Modified: | 23 Apr 2014 11:26 |
Published Version: | http://dx.doi.org/10.1016/j.matchar.2013.07.003 |
Status: | Published |
Publisher: | Elsevier |
Identification Number: | 10.1016/j.matchar.2013.07.003 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:78506 |