Hobby, MJ, Thomas, RE, Gascoyne, M et al. (4 more authors) (2013) MEMS-integrated load cell for measuring pressure, erosion, and deposition in dynamic environmental flows. IEEE Sensors Journal, 13 (2). 492 - 500. ISSN 1530-437X
Abstract
A microelectromechanical system-based load cell is integrated with signal conditioning circuitry, temperature, and tilt sensors for measurement of sediment-fluid interaction and flow under turbulent conditions. Such an instrument has potential value for quantifying geophysical flows and sediment dynamics within a range of environments. Sensor sensitivity is tested to a mass of 0.5 g but can be shown theoretically to extend to 50 mg. The sensor is found to have no attenuation of frequencies up to 2.5 Hz and would therefore be suitable for monitoring turbulent flow. Laboratory flume experiments, simulating a dam burst, demonstrate the applicability of the sensor for measuring highly dynamic and transient flow phenomena in unprecedented detail.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | (c) 2013, IEEE. This is an author produced version of a paper published in IEEE Sensors Journal. Uploaded in accordance with the publisher's self-archiving policy. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. |
Keywords: | environmental monitoring; erosion; flood; flow; load cell; microelectromechanical system |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Environment (Leeds) > School of Earth and Environment (Leeds) The University of Leeds > Faculty of Environment (Leeds) > School of Geography (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 30 Jul 2013 11:11 |
Last Modified: | 30 Jul 2013 11:56 |
Published Version: | http://dx.doi.org/10.1109/JSEN.2012.2217953 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers |
Identification Number: | 10.1109/JSEN.2012.2217953 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:76053 |