Measurement of the Ec.m.=184 keV Resonance Strength in the 26gAl(p,gamma)27Si Reaction

Ruiz, C., Parikh, A., José, J. et al. (29 more authors) (2006) Measurement of the Ec.m.=184 keV Resonance Strength in the 26gAl(p,gamma)27Si Reaction. Physical Review Letters, 96 (25). pp. 252501-1. ISSN 1079-7114

Abstract

Metadata

Item Type: Article
Authors/Creators:
  • Ruiz, C.
  • Parikh, A.
  • José, J.
  • Buchmann, L.
  • Caggiano, A.
  • Chen, A.A.
  • Clark, J.A.
  • Crawford, H.
  • Davids, B.
  • D'Auria, J.M.
  • Davis, C.
  • Deibel, C.
  • Erikson, L.
  • Fogarty, L.
  • Frekers, D.
  • Greife, U.
  • Hussein, A.
  • Hutcheon, A.
  • Huyse, M.
  • Jewett, C.
  • Laird, A.M.
  • Lewis, R.
  • Mumby-Croft, P.
  • Olin, A.
  • Ottewell, D.F.
  • Ouellet, C.V.
  • Parker, P.
  • Pearson, J.
  • Ruprecht, G.
  • Trinczek, M.
  • Vockenhuber, C.
  • Wrede, C.
Dates:
  • Published: 2006
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Physics (York)
Depositing User: York RAE Import
Date Deposited: 24 Feb 2009 14:26
Last Modified: 24 Feb 2009 14:26
Published Version: http://dx.doi.org/10.1103/PhysRevLett.96.252501
Status: Published
Publisher: The American Physical Society.
Identification Number: 10.1103/PhysRevLett.96.252501
Open Archives Initiative ID (OAI ID):

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