Effects of DUT mismatch on the noise figure characterization: A comparative analysis of two Y-factor techniques

Collantes, J.M., Pollard, R.D. and Sayed, M. (2002) Effects of DUT mismatch on the noise figure characterization: A comparative analysis of two Y-factor techniques. IEEE Transactions on Instrumentation and Measurement, 51 (6). pp. 1150-1156. ISSN 0018-9456

Abstract

Metadata

Item Type: Article
Authors/Creators:
  • Collantes, J.M.
  • Pollard, R.D.
  • Sayed, M.
Copyright, Publisher and Additional Information:

Copyright © 2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

Keywords: microwave characterization, noise figure, noise measurements, noise temperature, vector corrections, Y-factor technique
Dates:
  • Published: December 2002
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Pollard Institute (Leeds)
Depositing User: Sherpa Assistant
Date Deposited: 10 Oct 2005
Last Modified: 24 Oct 2016 19:54
Published Version: http://dx.doi.org/10.1109/TIM.2002.808015
Status: Published
Refereed: Yes
Identification Number: 10.1109/TIM.2002.808015
Open Archives Initiative ID (OAI ID):

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