Corrigendum to “STEM in an SEM: Towards High-Throughput Imaging and Analysis of Metal Nanoclusters” [Ultramicroscopy 285 (2026) 114400]

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Chen, Y., Fay, M.W., Theis, W. et al. (8 more authors) (2026) Corrigendum to “STEM in an SEM: Towards High-Throughput Imaging and Analysis of Metal Nanoclusters” [Ultramicroscopy 285 (2026) 114400]. Ultramicroscopy, 287. 114436. ISSN: 0304-3991

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Item Type: Article
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© 2026 The Author(s). This is an open access article under the terms of the Creative Commons Attribution License (CC-BY 4.0), which permits unrestricted use, distribution and reproduction in any medium, provided the original work is properly cited.

Dates:
  • Published (online): 31 August 2026
  • Published: 10 October 2026
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds)
Funding Information:
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Grant number
EPSRC Accounts Payable
EP/W021080/1
EPSRC Accounts Payable
EP/X035123/1
EPSRC Accounts Payable
EP/V036432/1
Date Deposited: 04 Nov 2026 14:32
Last Modified: 04 Nov 2026 14:32
Status: Published
Publisher: Elsevier
Identification Number: 10.1016/j.ultramic.2026.114436
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