Li, H. orcid.org/0000-0002-5956-4033 and Li, G.J. (Accepted: 2026) High-frequency injection-based inter-turn short-circuit fault detection in SPM machines considering current closed-loop control effect. IEEE transactions on industrial electronics (1982. Print). ISSN: 0278-0046 (In Press)
Abstract
This paper investigates optimal injection signal parameters for high-frequency injection–based inter-turn short-circuit fault detection in surface-mounted permanent magnet synchronous machines under closed-loop current control. Theoretical derivations about the injection fault signatures reveal a signal enhancement effect induced by the current closed-loop control, which is found to be effective for reducing the undesired injection harmonics. Based on this phenomenon, an optimal injection frequency can be determined within a reasonable frequency range. This selection method of injection frequency is proven experimentally robust across different fault severities. Furthermore, the minimal injection voltage is obtained with respect to a minimal detectable fault case and a desired signal-to-noise ratio. The proposed injection frequency selection method can yield optimal injection frequency which reduces the negative impacts of injection; the proposed calculation method of the minimal injection voltage provides an analytical approach to evaluate the trade-off between the detectability of the inter-turn short-circuit fault and the cost of injection.
Metadata
| Item Type: | Article |
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| Authors/Creators: |
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| Copyright, Publisher and Additional Information: | © 2026 IEEE |
| Keywords: | Fault detection; high-frequency signal injection; inter-turn short circuit; permanent-magnet synchronous machine |
| Dates: |
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| Institution: | The University of Sheffield |
| Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > School of Electrical and Electronic Engineering |
| Date Deposited: | 04 Aug 2026 11:40 |
| Last Modified: | 07 Aug 2026 16:05 |
| Status: | In Press |
| Publisher: | Institute of Electrical and Electronics Engineers |
| Refereed: | Yes |
| Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:244046 |

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