He, M., Chen, Z. and Maddock, S. orcid.org/0000-0003-3179-0263 (Accepted: 2026) SIC3D: Style image conditioned text-to-3D Gaussian Splatting Generation. In: 2026 IEEE International Conference on Multimedia and Expo (ICME). 2026 IEEE International Conference on Multimedia and Expo (ICME), 06-10 Jul 2026, Bangkok, Thailand. . Institute of Electrical and Electronics Engineers (IEEE). (In Press)
Abstract
Recent progress in text-to-3D object generation enables the synthesis of detailed geometry from text input by leveraging 2D diffusion models and differentiable 3D representations. However, the approaches often suffer from limited controllability and texture ambiguity due to the limitation of the text modality. To address this, we present SIC3D, a controllable image-conditioned text-to-3D generation pipeline with 3D Gaussian Splatting (3DGS). There are two stages in SIC3D. The first stage generates the 3D object content from text with a text-to3DGS generation model. The second stage transfers style from a reference image to the 3DGS. Within this stylization stage, we introduce a novel Variational Stylized Score Distillation (VSSD) loss to effectively capture both global and local texture patterns while mitigating conflicts between geometry and appearance. A scaling regularization is further applied to prevent the emergence of artifacts and preserve the pattern from the style image. Extensive experiments demonstrate that SIC3D enhances geometric fidelity and style adherence, outperforming prior approaches in both qualitative and quantitative evaluations.
Metadata
| Item Type: | Proceedings Paper |
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| Authors/Creators: |
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| Copyright, Publisher and Additional Information: | © 2026 The Author(s). |
| Keywords: | 3D Object Generation; Stylization |
| Dates: |
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| Institution: | The University of Sheffield |
| Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Computer Science (Sheffield) |
| Date Deposited: | 21 Apr 2026 13:57 |
| Last Modified: | 13 May 2026 08:35 |
| Status: | In Press |
| Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
| Refereed: | Yes |
| Related URLs: | |
| Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:240282 |
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Filename: ICME_2026.pdf

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