The impact on image formation of inevitable tip bending with modern high resolution atomic force microscopy probes

Chen, X. orcid.org/0000-0001-6987-5540, Swift, H.C., Hole, P. et al. (2 more authors) (2026) The impact on image formation of inevitable tip bending with modern high resolution atomic force microscopy probes. Nanoscale. ISSN: 2040-3364

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Item Type: Article
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© The Royal Society of Chemistry 2026. This article is licensed under a Creative Commons Attribution 3.0 Unported Licence. http://creativecommons.org/licenses/by/3.0/
Dates:
  • Submitted: 19 May 2025
  • Accepted: 2 January 2026
  • Published (online): 30 January 2026
  • Published: 30 January 2026
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Science (Sheffield) > Department of Physics and Astronomy (Sheffield)
The University of Sheffield > Faculty of Science (Sheffield) > School of Mathematical and Physical Sciences
The University of Sheffield > Faculty of Engineering (Sheffield) > School of Chemical, Materials and Biological Engineering
Date Deposited: 04 Feb 2026 11:23
Last Modified: 04 Feb 2026 11:23
Status: Published online
Publisher: Royal Society of Chemistry (RSC)
Refereed: Yes
Identification Number: 10.1039/d5nr02107c
Open Archives Initiative ID (OAI ID):

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