Towards automated chemical analysis of materials using secondary electron hyperspectral imaging and unsupervised learning

Zhang, J., Farr, N.T.H., Nohl, J. et al. (6 more authors) (2025) Towards automated chemical analysis of materials using secondary electron hyperspectral imaging and unsupervised learning. IEEE Access. ISSN: 2169-3536

Abstract

Metadata

Item Type: Article
Authors/Creators:
Copyright, Publisher and Additional Information:

© 2025 The Author(s). This work is licensed under a Creative Commons Attribution 4.0 License. For more information, see https://creativecommons.org/licenses/by/4.0/

Keywords: Advanced manufacturing; artificial intelligence; Gaussian mixture models; material surface chemistry; microscopy; probabilistic clustering; secondary electron spectroscopy; unsupervised learning
Dates:
  • Accepted: 15 September 2025
  • Published (online): 30 September 2025
  • Published: 30 September 2025
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > School of Electrical and Electronic Engineering
The University of Sheffield > Faculty of Engineering (Sheffield) > School of Chemical, Materials and Biological Engineering
Funding Information:
Funder
Grant number
Engineering and Physical Sciences Research Council
EP/V012126/1
Date Deposited: 29 Sep 2025 12:57
Last Modified: 01 Oct 2025 13:13
Status: Published online
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Refereed: Yes
Identification Number: 10.1109/ACCESS.2025.3615908
Related URLs:
Open Archives Initiative ID (OAI ID):

Export

Statistics