STICCER: Fast and effective database test suite reduction through merging of similar test cases

Alsharif, A., Kapfhammer, G.M. and McMinn, P. orcid.org/0000-0001-9137-7433 (2020) STICCER: Fast and effective database test suite reduction through merging of similar test cases. In: 2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST). 2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST), 24-28 Oct 2020, Porto, Portugal. Institute of Electrical and Electronics Engineers (IEEE) , pp. 220-230. ISBN: 9781728157795 ISSN: 2159-4848 EISSN: 2771-3091

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Item Type: Proceedings Paper
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Keywords: Data Management and Data Science; Information and Computing Sciences; Software Engineering; Generic health relevance
Dates:
  • Published (online): 5 August 2020
  • Published: 5 August 2020
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Computer Science (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 06 Aug 2025 15:57
Last Modified: 06 Aug 2025 15:57
Status: Published
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Refereed: Yes
Identification Number: 10.1109/icst46399.2020.00031
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