Where tests fall short: empirically analyzing oracle gaps in covered code

Maton, M., Kapfhammer, G.M. and McMinn, P. orcid.org/0000-0001-9137-7433 (2026) Where tests fall short: empirically analyzing oracle gaps in covered code. In: Proceedings of the 2025 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM). 2025 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM), 02-03 Oct 2025, Honolulu, Hawai, USA. Institute of Electrical and Electronics Engineers (IEEE). ISBN: 9798331591489.

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Item Type: Proceedings Paper
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© 2025 The Author(s). Except as otherwise noted, this author-accepted version of a conference paper published in Proceedings of the 2025 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM) is made available via the University of Sheffield Research Publications and Copyright Policy under the terms of the Creative Commons Attribution 4.0 International License (CC-BY 4.0), which permits unrestricted use, distribution and reproduction in any medium, provided the original work is properly cited. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/

Keywords: software testing; coverage gap; oracle gap; checked coverage; pseudo-tested
Dates:
  • Accepted: 17 June 2025
  • Published (online): 12 January 2026
  • Published: 12 January 2026
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Computer Science (Sheffield)
Funding Information:
Funder
Grant number
ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL
EP/X024539/1
Date Deposited: 07 Aug 2025 15:38
Last Modified: 16 Jan 2026 11:37
Status: Published
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Refereed: Yes
Identification Number: 10.1109/ESEM64174.2025.00063
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