Yoon, S.Y., Jee, S.J. orcid.org/0000-0001-9582-8289 and Sohn, S.Y. orcid.org/0000-0002-3958-2269 (2021) Mapping and identifying technological coopetition: a multi-level approach. Scientometrics, 126 (7). pp. 5797-5817. ISSN: 0138-9130
Abstract
Firms competing over technologies are often forced to collaborate while pursuing their risky research and development (R&D); this is called “technological coopetition.” Such coopetition creates complex interfirm technological relationships, which vary according to the technology field wherein the competition and cooperation are occurring. This study proposes a framework by which to map and identify technological coopetition at both the interfirm and industry levels in order to clarify the complex relational state of technological coopetition. The framework distinguishes between coopetition types by considering the relatedness between the technology areas in which competition and cooperation occur, while showing how interfirm relationships change over time. At the industry level, the framework shows the technology fields in which competition, cooperation, and coopetition occur frequently. We illustrate the framework by applying it to the semiconductor industry. This study is expected to contribute to the coopetition literature as well as R&D management practice.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Keywords: | Coopetition, Technology development, Patent analysis, Semiconductor industry |
Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Business (Leeds) > Analytics, Technology & Ops Department |
Depositing User: | Symplectic Publications |
Date Deposited: | 29 Jul 2025 07:59 |
Last Modified: | 29 Jul 2025 14:20 |
Published Version: | https://link.springer.com/article/10.1007/s11192-0... |
Status: | Published |
Publisher: | Springer |
Identification Number: | 10.1007/s11192-021-04005-x |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:229503 |