Mapping and identifying technological coopetition: a multi-level approach

Yoon, S.Y., Jee, S.J. orcid.org/0000-0001-9582-8289 and Sohn, S.Y. orcid.org/0000-0002-3958-2269 (2021) Mapping and identifying technological coopetition: a multi-level approach. Scientometrics, 126 (7). pp. 5797-5817. ISSN: 0138-9130

Abstract

Metadata

Item Type: Article
Authors/Creators:
Keywords: Coopetition, Technology development, Patent analysis, Semiconductor industry
Dates:
  • Accepted: 17 April 2021
  • Published (online): 18 May 2021
  • Published: July 2021
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Business (Leeds) > Analytics, Technology & Ops Department
Depositing User: Symplectic Publications
Date Deposited: 29 Jul 2025 07:59
Last Modified: 29 Jul 2025 14:20
Published Version: https://link.springer.com/article/10.1007/s11192-0...
Status: Published
Publisher: Springer
Identification Number: 10.1007/s11192-021-04005-x
Open Archives Initiative ID (OAI ID):

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