George, A., Shepherd, W., Tait, S. et al. (2 more authors) (Accepted: 2025) A deep learning benchmark analysis of the publicly available WRc dataset for sewer defect classification. In: Proceedings of 21st Computing & Control for the Water Industry Conference (CCWI 2025). CCWI 2025 - 21st Computing & Control for the Water Industry Conference, 01-03 Sep 2025, Sheffield, UK. (In Press)
Abstract
Deep learning has the potential to transform sewer pipe inspection by automating the process, which could improve efficiency and consistency. However, progress has been hampered by limited publicly available, wellannotated benchmark datasets for defect classification. To address this gap, we present a comprehensive analysis using the publicly available Water Research Centre (WRc) sewer image dataset. We evaluated several deep learning architectures (MobileNet-v2, Inception-ResNet-v2 and ResNet-18) across key performance metrics such as accuracy and F1-score, with Top-1 accuracies ranging from 61.54% to 71.61% and Top-3 accuracies ranging from 86.88% to 92.61%. This research contributes to a reproducible performance baseline, enabling rigorous comparison of different models and serves as a foundation for future research in developing AI-assisted inspection systems.
Metadata
Item Type: | Proceedings Paper |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2025 The Author(s). |
Keywords: | CCTV Inspection; Deep Learning; Sewer Defect Detection |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > School of Electrical and Electronic Engineering |
Funding Information: | Funder Grant number EUROPEAN COMMISSION - HORIZON EUROPE 101189847 |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 15 Jul 2025 10:36 |
Last Modified: | 15 Jul 2025 10:37 |
Status: | In Press |
Refereed: | Yes |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:229125 |
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Filename: Alex_CCWI2025_Paper_Final.pdf
