Metadata
| Item Type: | Conference abstract |
|---|---|
| Authors/Creators: |
|
| Commentary on: | Ilett, M., S'ari, M., Freeman, H. et al. (10 more authors) Analysis of Complex, Beam-Sensitive Systems by Electron Microscopy. In: Microscopy & Microanalysis 2022, 31 Jul - 04 Aug 2022, Portland, OR, USA. (Unpublished) |
| Dates: |
|
| Institution: | The University of Leeds |
| Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds) The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemistry (Leeds) The University of Leeds > Central Admin & Support Services (CASS) > Research and Innovation Service |
| Date Deposited: | 06 Nov 2026 13:46 |
| Last Modified: | 06 Nov 2026 13:46 |
| Status: | Published |
| Publisher: | Oxford University Press (OUP) |
| Identification Number: | 10.1017/s1431927622008509 |
| Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:228817 |
Commentary/Response Threads
-
Ilett, M., S'ari, M., Freeman, H., Aslam, Z., Koniuch, N., Cattle, J., Hooley, R., Roncal-Herrero, T., Collins, S.M., Hondow, N., Brown, A., Brydson, R. and Freeman, H.
Analysis of Complex, Beam-Sensitive Systems by Electron Microscopy. (deposited 06 Nov 2026 13:41)
- Ilett, M., Freeman, H., Aslam, Z., Afzali, M., Galloway, J., Meldrum, F. and Brydson, R. Analysis of Complex, Beam-Sensitive Systems by Electron Microscopy. (deposited 06 Nov 2026 13:46) [Currently Displayed]
CORE (COnnecting REpositories)
CORE (COnnecting REpositories)