Transmission electron microscopy of epitaxial semiconductor materials and devices

Dong, J. orcid.org/0000-0002-3853-1910, Bai, H., Deng, Y. et al. (5 more authors) (2025) Transmission electron microscopy of epitaxial semiconductor materials and devices. Journal of Physics D: Applied Physics, 58 (4). 043001. ISSN 0022-3727

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Item Type: Article
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© 2024 The Authors. Except as otherwise noted, this author-accepted version of a journal article published in Journal of Physics D: Applied Physics is made available via the University of Sheffield Research Publications and Copyright Policy under the terms of the Creative Commons Attribution 4.0 International License (CC-BY 4.0), which permits unrestricted use, distribution and reproduction in any medium, provided the original work is properly cited. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/

Dates:
  • Published: 27 January 2025
  • Published (online): 4 November 2024
  • Accepted: 23 October 2024
  • Submitted: 29 February 2024
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > School of Electrical and Electronic Engineering
Depositing User: Symplectic Sheffield
Date Deposited: 25 Oct 2024 11:06
Last Modified: 12 Nov 2024 08:51
Status: Published
Publisher: IOP Publishing
Refereed: Yes
Identification Number: 10.1088/1361-6463/ad8a6b
Open Archives Initiative ID (OAI ID):

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