Unsupervised learning assisted secondary electron hyperspectral imaging for high-throughput cheminformatics analysis of materials

Zhang, J., Nohl, J., Farr, N. orcid.org/0000-0001-6761-3600 et al. (2 more authors) (2024) Unsupervised learning assisted secondary electron hyperspectral imaging for high-throughput cheminformatics analysis of materials. In: Qvortrup, K. and Weede, K., (eds.) BIO Web of Conferences. The 17th European Microscopy Congress (EMC 2024), 25-30 Aug 2024, Copenhagen, Denmark. EDP Sciences

Metadata

Item Type: Proceedings Paper
Authors/Creators:
Editors:
  • Qvortrup, K.
  • Weede, K.
Copyright, Publisher and Additional Information:

© The Authors, published by EDP Sciences. This is an open access article distributed under the terms of the Creative Commons Attribution License 4.0 (https://creativecommons.org/licenses/by/4.0/).
Keywords: SEHI; clustering; material cheminformatics; segmentation
Dates:
  • Published: 17 October 2024
  • Published (online): 17 October 2024
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > School of Chemical, Materials and Biological Engineering
Depositing User: Symplectic Sheffield
Date Deposited: 23 Oct 2024 10:19
Last Modified: 23 Oct 2024 10:19
Status: Published
Publisher: EDP Sciences
Refereed: Yes
Identification Number: 10.1051/bioconf/202412910012
Related URLs:
Open Archives Initiative ID (OAI ID):

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