Low excess noise and high quantum efficiency avalanche photodiodes for beyond 2 µm wavelength detection

Jung, H. orcid.org/0000-0002-5250-4767, Lee, S. orcid.org/0000-0002-5669-1555, Jin, X. orcid.org/0000-0002-7205-3318 et al. (5 more authors) (2024) Low excess noise and high quantum efficiency avalanche photodiodes for beyond 2 µm wavelength detection. Communications Materials, 5 (1). 219. ISSN 2662-4443

Abstract

Metadata

Item Type: Article
Authors/Creators:
Copyright, Publisher and Additional Information:

© The Author(s) 2024. This article is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License, which permits any non-commercial use, sharing, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if you modified the licensed material. You do not have permission under this licence to share adapted material derived from this article or parts of it. The images or other third party material in this article are included in the article’s Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/bync-nd/4.0/.

Keywords: Electrical and electronic engineering; Electronics, photonics and device physics
Dates:
  • Published: 9 October 2024
  • Published (online): 9 October 2024
  • Accepted: 29 August 2024
  • Submitted: 15 July 2024
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > School of Electrical and Electronic Engineering
Depositing User: Symplectic Sheffield
Date Deposited: 16 Oct 2024 08:18
Last Modified: 16 Oct 2024 08:18
Status: Published
Publisher: Springer Science and Business Media LLC
Refereed: Yes
Identification Number: 10.1038/s43246-024-00627-9
Open Archives Initiative ID (OAI ID):

Download

Export

Statistics