Turner, M.C. orcid.org/0000-0003-2161-7635 and Drummond, R. orcid.org/0000-0002-2586-1718 (2020) Analysis of systems with slope restricted nonlinearities using externally positive Zames–Falb multipliers. IEEE Transactions on Automatic Control, 65 (4). pp. 1660-1667. ISSN 0018-9286
Abstract
This paper proposes an approach for assessing the stability of feedback interconnections where one element is a static slope-restricted nonlinearity and the other element is a linear system. The approach is based on the use of Zames-Falb multipliers where the dynamic portion of the multiplier is chosen as an externally positive noncausal transfer function. By restricting attention to a subset of these multipliers, a set of pure linear matrix inequality conditions is obtained which requires no initial parameterization by the user. A useful byproduct of using externally positive systems is that the results are applicable to nonodd slope restricted nonlinearities, which is not the case for all classes of Zames-Falb multipliers.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. Reproduced in accordance with the publisher's self-archiving policy. |
Keywords: | Linear matrix inequality (LMI); single-input-single-output (SISO); Zames-Falb multipliers |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Automatic Control and Systems Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 14 Feb 2024 11:03 |
Last Modified: | 14 Feb 2024 11:03 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
Refereed: | Yes |
Identification Number: | 10.1109/tac.2019.2930796 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:209084 |