Hu, Z. orcid.org/0000-0001-7306-883X, Zhang, Y., Li, P. et al. (2 more authors) (2023) Near-field multi-slice ptychography: quantitative phase imaging of optically thick samples with visible light and X-rays. Optics Express, 31 (10). p. 15791. ISSN 1094-4087
Abstract
Ptychography is a form of lens-free coherent diffractive imaging now used extensively in electron and synchrotron-based X-ray microscopy. In its near-field implementation, it offers a route to quantitative phase imaging at an accuracy and resolution competitive with holography, with the added advantages of extended field of view and blind deconvolution of the illumination beam profile from the sample image. In this paper we show how near-field ptychography can be combined with a multi-slice model, adding to this list of advantages the unique ability to recover high-resolution phase images of larger samples, whose thickness places them beyond the depth of field of alternative methods.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2023. Published by Optica Publishing Group under the terms of the Creative Commons Attribution 4.0 License. (https://creativecommons.org/licenses/by/4.0/) Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI. |
Keywords: | Quantum Physics; Physical Sciences; Bioengineering |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 31 Jan 2024 10:28 |
Last Modified: | 31 Jan 2024 10:28 |
Status: | Published |
Publisher: | Optica Publishing Group |
Refereed: | Yes |
Identification Number: | 10.1364/oe.487002 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:208495 |