Frost, William James orcid.org/0000-0001-5249-1006, Carpenter, Robert and Vallejo Fernandez, Gonzalo orcid.org/0000-0002-4826-1547 (2024) Anisotropy constant of antiferromagnetic Pt50Mn50. Journal of Physics D: Applied Physics. 185003. ISSN 1361-6463
Abstract
We have measured the anisotropy constant of polycrystalline PtMn thin films deposited on different seed layer materials: Pt, Ru and Nb. Values as high as 2.5x10^7 erg/cc were achieved for samples deposited on Pt. The films can be crystallised into the antiferromagnetic, face-centred-tetragonal phase on Ru and Pt seed layers at annealing temperatures compatible with back-end-of-line conditions of up to 400C for one to three hours. Additionally these antiferromagnetic layers, 8 nm thick, are highly thermally stable with median blocking temperatures above 200C. The effect of diffusion on the stoichiometry of the PtMn layers is discussed with regards to the different seed layer materials.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2024 The Author(s) |
Dates: |
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Institution: | The University of York |
Academic Units: | The University of York > Faculty of Sciences (York) > Physics (York) |
Depositing User: | Pure (York) |
Date Deposited: | 17 Jan 2024 10:40 |
Last Modified: | 30 Mar 2025 00:10 |
Published Version: | https://doi.org/10.1088/1361-6463/ad2564 |
Status: | Published |
Refereed: | Yes |
Identification Number: | 10.1088/1361-6463/ad2564 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:207804 |
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Filename: Frost_2024_J._Phys._D_Appl._Phys._57_185003.pdf
Description: Anisotropy constant of antiferromagnetic Pt50Mn50
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