Rainey, J., Elawady, M., Abhayartne, C. et al. (1 more author) (2023) TRAIT: A trusted media distribution framework. In: 2023 24th International Conference on Digital Signal Processing (DSP). 2023 24th International Conference on Digital Signal Processing, 11-13 Jun 2023, Island of Rhodes, Greece. Institute of Electrical and Electronics Engineers (IEEE) ISBN 979-8-3503-3959-8
Abstract
Trusted distribution and consumption of media content has become a challenging issue, especially with the advancement of machine learning-based techniques such as deep fake. To address such challenges, this paper proposes a new metadata schema which is embedded within a larger framework that facilitates trusted media distribution. This schema is realised through a distributed media blockchain core in conjunction with algorithms to detect media modifications. Such a framework is expected to improve trust in media consumption, ensuring media integrity, authenticity and provenance.
Metadata
Item Type: | Proceedings Paper |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2023 The Authors. Except as otherwise noted, this author-accepted version of a paper published in 2023 24th International Conference on Digital Signal Processing is made available via the University of Sheffield Research Publications and Copyright Policy under the terms of the Creative Commons Attribution 4.0 International License (CC-BY 4.0), which permits unrestricted use, distribution and reproduction in any medium, provided the original work is properly cited. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ |
Keywords: | Industries; Machine learning algorithms; Signal processing algorithms; Insurance; Digital signal processing; Media; Metadata |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 04 Jan 2024 15:23 |
Last Modified: | 04 Jan 2024 15:24 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
Refereed: | Yes |
Identification Number: | 10.1109/dsp58604.2023.10167909 |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:206918 |